Abstract
Benchmark circuits provide a basis for both research institutions and industry to measure their methods and products against. This paper focuses on utilization of recently published FITTest BENCH06 benchmarks for measuring quality of our novel academic design for testability tool called CADeT. The paper presents basic characteristics of benchmarks and CADeT tool, provides results and analysis of implementing individual testing techniques and their constraint-driven combination to particular benchmarks.
Keywords
Cite this article
@article{cai-1722,
author = {Josef Strnadel and Tomáš Pečenka and Zdeněk Kotásek},
title = {Measuring CADeT Performance by Means of FITTest _BENCH06 Benchmark Circuits},
journal = {Computing and Informatics},
volume = {27},
number = {6},
pages = {913--930},
year = {2008},
issn = {1335-9150},
url = {https://cai.type.sk/content/2008/6/measuring-cadet-performance-by-means-of-fittest-_bench06-benchmark-circuits/}
}
TY - JOUR AU - Josef Strnadel AU - Tomáš Pečenka AU - Zdeněk Kotásek TI - Measuring CADeT Performance by Means of FITTest BENCH06 Benchmark Circuits JO - Computing and Informatics VL - 27 IS - 6 SP - 913 EP - 930 PY - 2008 SN - 1335-9150 UR - https://cai.type.sk/content/2008/6/measuring-cadet-performance-by-means-of-fittest-_bench06-benchmark-circuits/ KW - Benchmark KW - design for testability KW - register-transfer level KW - test point insertion KW - scan design technique ER -
Strnadel, J., Pečenka, T., & Kotásek, Z. (2008). Measuring CADeT Performance by Means of FITTest BENCH06 Benchmark Circuits. Computing and Informatics, 27(6), 913–930. https://cai.type.sk/content/2008/6/measuring-cadet-performance-by-means-of-fittest-_bench06-benchmark-circuits/