Measuring CADeT Performance by Means of FITTest _BENCH06 Benchmark Circuits

keywords: Benchmark, design for testability, register-transfer level, test point insertion, scan design technique
Benchmark circuits provide a basis for both research institutions and industry to measure their methods and products against. This paper focuses on utilization of recently published FITTest _BENCH06 benchmarks for measuring quality of our novel academic design for testability tool called CADeT. The paper presents basic characteristics of benchmarks and CADeT tool, provides results and analysis of implementing individual testing techniques and their constraint-driven combination to particular benchmarks.
reference: Vol. 27, 2008, No. 6, pp. 913–930